Image processing method for inspecting with analysis of binarize

Details Image processing method for inspecting with analysis of binarize Image processing method for inspecting with analysis of binarize

1996-12-03

1998-08-04

Rogers, Scott

Image analysis

Applications

Manufacturing or product inspection

382260, 382263, 382264, 382275, 382277, 382237, G06K 940

Patent

active

057906947

ABSTRACT:
Input image data is wavelet-transformed in correspondence with each position on its frame (S.sub.1), a combination image area of X-axis (or Y-axis) high-pass information and Y-axis (or X-axis) low-pass information in the transformed image data is subjected to binary processing (S.sub.3), an isolated point is removed from the binary image data (S.sub.4), after which the number of pixels of a value "1" is counted (S.sub.5), and the device under test is judged as non-defective or defective, depending on whether the count value is larger than a predetermined value (S.sub.7).

REFERENCES:
patent: 5504438 (1996-04-01), Henley
patent: 5586058 (1996-12-01), Aloni et al.
patent: 5717780 (1998-02-01), Mitsumune et al.

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