Image analysis – Applications – Manufacturing or product inspection
Patent
1996-01-23
1998-02-17
Shalwala, Bipin
Image analysis
Applications
Manufacturing or product inspection
348 94, 382153, 382171, 382174, 382283, 382291, 382201, 382203, G06K 900, G06K 934, G06K 936, G06K 920
Patent
active
057199531
ABSTRACT:
An image processing apparatus is provided which is capable of a high-speed process for obtaining a projection histogram. A digitizing unit subjects a video signal, obtained by acquiring an image of a target mark with a camera, to horizontal scanning and slicing to obtain a binary signal. A window signal output unit, coupled to the digitizing unit, outputs a window signal in accordance with a preset window area. An in-window signal output unit is connected to the outputs of the digital unit and the window signal output unit to perform a logical AND operation on the binary signal and the window signal and outputs an in-window binary signal. A histogram creating unit is coupled to the output of the in-window signal output unit to create a projection histogram by successively counting the high- and low-level states of the in-window binary signal generated as the horizontal scanning progresses. During a horizontal scanning (image scanning) corresponding to one screen, digitization of the video signal, window setting, and generation of the in-window binary signal are carried out, and further a histogram is created based on the in-window binary signal. Namely, scanning the video signal (image) once is sufficient to create a projection histogram.
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Okabayashi Keiju
Yasukawa Yusuke
Fujitsu Limited
Shalwala Bipin
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