Image analysis – Pattern recognition
Reexamination Certificate
2011-07-26
2011-07-26
Tabatabai, Abolfazl (Department: 2624)
Image analysis
Pattern recognition
C701S201000
Reexamination Certificate
active
07986838
ABSTRACT:
The present invention provides an image processing apparatus capable of preventing deterioration of judgment accuracy when performing document matching process. To be more specific, when selecting feature points in the neighborhood of a target feature point, a predetermined number of feature points are selected after excluding a prespecified number of feature points in turn from the feature point nearest to the target feature point. For example, when the plurality of feature points are selected, the plurality of feature points, after excluding at least a feature point existing at a position nearest to the target feature point, are selected. Thereby, without increasing the amount of feature points for calculation of features (feature vectors), it is possible to prevent the deterioration of judgment accuracy.
REFERENCES:
patent: 5465353 (1995-11-01), Hull et al.
patent: 5867386 (1999-02-01), Hoffberg et al.
patent: 1 914 680 (2008-04-01), None
patent: WO-2006/092957 (2006-09-01), None
Ohira Masakazu
Yoshimura Hideyoshi
Birch & Stewart Kolasch & Birch, LLP
Sharp Kabushiki Kaisha
Tabatabai Abolfazl
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