Image pickup device and method of manufacturing the same

Active solid-state devices (e.g. – transistors – solid-state diode – Responsive to non-electrical signal – Electromagnetic or particle radiation

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S432000, C257SE31127

Reexamination Certificate

active

07550811

ABSTRACT:
The present invention relates to an image pickup device, etc., having a structure such that electrostatic discharge is unlikely to occur when an FOP and a CCD reading part are joined. This image pickup device comprises a semiconductor substrate, provided with the CCD reading part on a front surface that opposes a back surface, which serves as a light-incident surface, a package having a cavity in which the semiconductor substrate is fixed, a cover covering an upper opening of the cavity, an FOP joined to the semiconductor substrate, and electrical wirings. The cover has a guiding opening for inserting the FOP into the cavity, and the semiconductor substrate is thinned at a portion corresponding to a region at which the CCD reading part is disposed. Also, the semiconductor substrate is fixed to a bottom surface of the cavity such that the CCD reading part and the bottom surface face each other, and a light outgoing end surface of the FOP is optically coupled to the thin part of the semiconductor substrate in the state of being inserted into the cavity from the guiding opening.

REFERENCES:
patent: 4760031 (1988-07-01), Janesick
patent: 62-189883 (1987-08-01), None
patent: 06-196680 (1994-07-01), None
patent: 06196680 (1994-07-01), None
patent: 09-199699 (1997-07-01), None
patent: 11-188033 (1999-07-01), None
patent: 11188033 (1999-07-01), None
patent: 2000-028735 (2000-01-01), None
patent: 2000-324400 (2000-11-01), None
patent: 2002-033467 (2002-01-01), None
Sol M. Gruner et al., “Charge-Coupled Device Area X-ray Detectors”, Review of Scientific Instruments, American Institute of Physics, US, vol. 73, No. 8, Aug. 2002, pp. 2815-2842.
A.R. Faruqi et al., “A High Sensitivity Imaging Detector For Electron Microscopy”, Nuclear Instruments & Methods in Physics Research A 367 (1995), pp. 408-412.
A.R. Faruqi et al., “Digital Detectors For Electron Microscopy”, Nuclear Instruments & Methods in Physics Research A 478 (2002), pp. 88-97.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Image pickup device and method of manufacturing the same does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Image pickup device and method of manufacturing the same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Image pickup device and method of manufacturing the same will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4134782

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.