Image pickup device

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer

Reexamination Certificate

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Details

C356S369000

Reexamination Certificate

active

07046360

ABSTRACT:
In an imaging apparatus, a detection section9detects a beam LFhaving passed through an aperture5in a first direction and a location designation beam LBhaving passed through the aperture5in the opposite direction is made incident to a position (x,y) in a first light image IM1on an image pickup surface corresponding to a specific position (x,y) in a second light image IM2,whereby the result of detection of the beam LFdetected at the detection section9indicates data at a specific position in an incoming light image designated by the location designation beam LB, regardless of whether there is a mechanical error in movement of the aperture5.

REFERENCES:
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patent: 4712889 (1987-12-01), Schindl
patent: 4844617 (1989-07-01), Kelderman et al.
patent: 5754335 (1998-05-01), Takagi et al.
patent: 0 211 590 (1987-02-01), None
patent: 5 181066 (1993-07-01), None
patent: 07-168103 (1995-07-01), None
patent: 7 199079 (1995-08-01), None
patent: 8 114753 (1996-05-01), None
Wilson et al., “Theory and Practice of Scanning Optical Microscopy”, Academic press, England, 1984, pp. 173-175.
Fujita et al., “New Optical Microscopes” Gakusai Kikaku K.K., p. 31.

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