Image pick-up semiconductor device capable of testing...

Details Image pick-up semiconductor device capable of testing... Image pick-up semiconductor device capable of testing...

2007-06-19

2007-06-19

Young, Brian (Department: 2819)

Coded data generation or conversion

Analog to or from digital conversion

Analog to digital conversion

C341S155000

Reexamination Certificate

active

11318888

ABSTRACT:
Provided is an image pick-up semiconductor device capable of testing operating characteristics of an analog-digital converter while the image pick-up semiconductor device operates. The device includes an active pixel sensor array having a plurality of pixels converting optical signals input from an external source into electrical signals, a columnar analog-digital converter converting signals output from the active pixel sensor array into first digital data, and a test analog-digital converter receiving two external signals and converting a voltage difference between the two external signals into second digital data.

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patent: 5877715 (1999-03-01), Gowda et al.
patent: 6366312 (2002-04-01), Crittenden
patent: 6583817 (2003-06-01), Lee
patent: 6734897 (2004-05-01), Mentzer
patent: 6903670 (2005-06-01), Lee et al.
patent: 10/20030037212 (2003-05-01), None
patent: 1020040095990 (2004-11-01), None

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