Optics: eye examining – vision testing and correcting – Eye examining or testing instrument – Objective type
Reexamination Certificate
2006-02-21
2006-02-21
Casler, Brian L. (Department: 3737)
Optics: eye examining, vision testing and correcting
Eye examining or testing instrument
Objective type
Reexamination Certificate
active
07001019
ABSTRACT:
An image observation apparatus is constructed to project image information displayed on an image display device for displaying the image information, onto a retina of an observing eye by a display optical system, thereby permitting an observer to observe the image information, and to perform control to change a position of an incident beam onto the entrance pupil plane of the observing eye. The apparatus is arranged to detect the position of the observer's pupil and change the position of the incident beam onto the entrance pupil plane of the observing eye, based on the result of the detection.
REFERENCES:
patent: 5231674 (1993-07-01), Cleveland et al.
patent: 5610673 (1997-03-01), Rafal et al.
patent: 5703637 (1997-12-01), Miyazaki et al.
patent: 5714967 (1998-02-01), Okamura et al.
patent: 5719701 (1998-02-01), Sudo
patent: 5825539 (1998-10-01), Hoshi
patent: 6023373 (2000-02-01), Inoguchi et al.
patent: 6094241 (2000-07-01), Yamazaki
patent: 6229561 (2001-05-01), Son et al.
patent: 6233003 (2001-05-01), Ono
patent: 6377295 (2002-04-01), Woodgate et al.
patent: 6417895 (2002-07-01), Tabata et al.
patent: 2002/0034016 (2002-03-01), Inoguchi et al.
patent: 2002/0036750 (2002-03-01), Eberl et al.
patent: 10047237 (2002-04-01), None
patent: 07-311361 (1995-11-01), None
patent: 08-211325 (1996-08-01), None
patent: 08-334730 (1996-12-01), None
patent: 09-166760 (1997-06-01), None
patent: 09-281438 (1997-10-01), None
patent: 10-111475 (1998-04-01), None
patent: 2001-42257 (2001-02-01), None
Yoshihiro Kajiki, “3-D Display in which Super Multi-Eye Area is Employed,” Optical and Electro-Optical Contact, vol. 26, No. 11, Nov. 20, 1998, Japan Optoelectro-Mechanics Association, pp. 624-631. (with English translation).
Osaka Tsutomu
Takagi Akinari
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