Image analysis – Applications – Surface texture or roughness measuring
Reexamination Certificate
2011-01-11
2011-01-11
Rashid, David P (Department: 2624)
Image analysis
Applications
Surface texture or roughness measuring
C382S141000, C356S614000, C702S158000
Reexamination Certificate
active
07869622
ABSTRACT:
Within a prioritized mode selection dialog, either a measurement accuracy prioritized mode or a measurement speed prioritized mode is selected. If the measurement accuracy prioritized mode is selected, then processing for entering a tolerable amount of movement is executed. Then, a relative movement speed of a CCD camera to a measurement stage is calculated from the entered amount of movement. Finally, image information is captured at a lower speed than the calculated relative movement speed to execute image measurement. If the measurement speed prioritized mode is selected, then processing for entering a relative movement speed is executed, and image information is captured at the entered relative movement speed to execute image measurement.
REFERENCES:
patent: 6023680 (2000-02-01), Wooster et al.
patent: 6161079 (2000-12-01), Zink et al.
patent: 6286055 (2001-09-01), Yamazaki et al.
patent: 6490541 (2002-12-01), Ariga et al.
patent: 6722554 (2004-04-01), Saito
patent: 6816609 (2004-11-01), Shimizu et al.
patent: 6950552 (2005-09-01), Nair et al.
patent: 2004/0103548 (2004-06-01), Jordil et al.
patent: 2004/0109205 (2004-06-01), Asano et al.
patent: 2004/0156054 (2004-08-01), Christoph
patent: 2004/0188643 (2004-09-01), Weiss et al.
patent: 2005/0109959 (2005-05-01), Wasserman et al.
patent: 0 532 169 (1993-03-01), None
patent: A-08-101017 (1996-04-01), None
patent: A-10-123016 (1998-05-01), None
patent: A-2003-208605 (2003-07-01), None
patent: A 2004-535587 (2004-11-01), None
patent: A-2006-084444 (2006-03-01), None
Japanese Office Action issued on Sep. 7, 2010 for Japanese Application No. 2005-164601 (with translation).
Komatsu Koichi
Matsumiya Sadayuki
Mitutoyo Corporation
Oliff & Berridg,e PLC
Rashid David P
LandOfFree
Image measuring system, image measuring method and image... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Image measuring system, image measuring method and image..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Image measuring system, image measuring method and image... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2648212