Optics: measuring and testing – Shape or surface configuration
Reexamination Certificate
2007-09-11
2007-09-11
Chowdhury, Tarifur (Department: 2886)
Optics: measuring and testing
Shape or surface configuration
Reexamination Certificate
active
11437697
ABSTRACT:
An image measuring method comprises making no stop of an imaging means relative to a measurement stage at measurement positions (MP1-MP3), and capturing instantaneous images to acquire information required for measurement. A first direction to a measurement position (MP1) to be measured next and a second direction from the measurement position (MP1) to a next measurement position (MP2) form an angle therebetween. If this angle exceeds a certain angle, an overshoot path is formed at a location beyond the measurement position (MP1) in the first direction. The larger the angle formed between the first direction and the second direction, the lower the measurement speed at the measurement position (MP1) is made.
REFERENCES:
patent: 5122648 (1992-06-01), Cohen et al.
patent: 5446548 (1995-08-01), Gerig et al.
patent: 5852672 (1998-12-01), Lu
patent: 6131301 (2000-10-01), Sutherland
patent: 2003/0222197 (2003-12-01), Reese et al.
patent: 2004/0103548 (2004-06-01), Jordil et al.
patent: 2004/0156054 (2004-08-01), Christoph
patent: 2006/0227336 (2006-10-01), Dinner et al.
patent: 0 599 513 (1994-06-01), None
Komatsu Koichi
Matsumiya Sadayuki
Sonobe Hirato
Akanbi Isiaka O
Chowdhury Tarifur
Mitutoyo Corporation
LandOfFree
Image measuring method, image measuring system and image... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Image measuring method, image measuring system and image..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Image measuring method, image measuring system and image... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3793213