Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2011-06-21
2011-06-21
Chawan, Sheela C (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C382S145000, C382S149000, C382S260000, C250S370110, C430S494000
Reexamination Certificate
active
07965883
ABSTRACT:
The method comprises a first step (S1in FIG.1) of obtaining a transmission image, a second step (S2) of applying a quadratic differential filter to the transmission image, thereby to emphasize a part of large luminance change as a quadratic differential filter image, a third step (S3) of binarizing the quadratic differential filter image with a predetermined threshold value, and then storing the resulting binarized image, a fourth step (S4) of binarizing the transmission image with another predetermined threshold value, and then storing the resulting binarized image, a fifth step (S5) of performing the measurement of binary feature quantities for the binarized image stored at the third step (S3) and the binarized image stored at the fourth step (S4), and a sixth step (S6) of deciding the quality of the object to-be-inspected from the binary feature quantities.
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Nishino Hirohisa
Uno Masahiko
Buchanan & Ingersoll & Rooney PC
Chawan Sheela C
Mitsubishi Electric Corporation
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