Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-04-04
2006-04-04
Nguyen, Vinh (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S701000, C324S765010, C324S1540PB
Reexamination Certificate
active
07023232
ABSTRACT:
A defect detection of light-emitting diodes (LEDs) is electrically performed on a large-scale display, comprising a plurality of light-emitting diodes arranged by a predetermined arrangement on an image display face, voltage detection portions for applying a constant current to a plurality of light-emitting diodes in an off region at a forward voltage or less in accordance with an input of a signal indicating a defect detection mode and detecting voltages between terminals of light-emitting diodes arising when the constant current flows there through, and a defect detection portion for electrically detecting a defect from the plurality of light-emitting diodes based on detection results of the voltage detection portion; and drive circuit devices (driver ICs) having the above configuration are serially connected and an electric signal indicating a result of defect detection is output from its final stage.
REFERENCES:
patent: 3742356 (1973-06-01), Brock
patent: 4346347 (1982-08-01), Kamata et al.
patent: 2005/0017922 (2005-01-01), Devos et al.
patent: 04-305173 (1992-10-01), None
Kawase Masataka
Komatsu Yoshihiro
Suzuki Mitsuru
Takagi Yuichi
Yano Motoyasu
Chan Emily Y
Kananen Ronald P.
Nguyen Vinh
Rader & Fishman & Grauer, PLLC
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