Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2007-09-04
2007-09-04
Tang, Minh N. (Department: 2829)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S763010, C349S038000
Reexamination Certificate
active
11420577
ABSTRACT:
It is the object of the present invention to provide a simple and accurate testing circuit and a testing method while occupying as small space as possible in an image display device. By partly changing dummy pixels arranged in the periphery of a display region into a testing circuit, tests for detecting broken wires in data signal lines and scanning lines and whether pixels are controlled adequately can be conducted easily and accurately, occupying as small space as possible without a need of an additional complicated circuit. Accordingly, a display panel can be produced at a low cost.
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Fish & Richardson P.C.
Semicondcutor Energy Laboratory Co., Ltd.
Tang Minh N.
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