Image display apparatus with particular electron emission...

Electric lamp and discharge devices – With luminescent solid or liquid material – Vacuum-type tube

Reexamination Certificate

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C313S495000, C313S496000, C313S310000

Reexamination Certificate

active

07977859

ABSTRACT:
Degradation of an electron emission element by irradiation of the positive ion generated inside a panel is suppressed. A deflection electrode is periodically disposed, and the electron emission region of an electron emission element is disposed so as not to include a center line between adjacent deflection electrodes, so that an electron beam trajectory is deflected and bombardment or irradiation of the generated positive ion to the electron emission region is prevented.

REFERENCES:
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patent: 2006/0186781 (2006-08-01), Kuroda et al.
patent: 2006/0267471 (2006-11-01), Hwang et al.
patent: 2006/0290259 (2006-12-01), Song et al.
patent: 2007/0138939 (2007-06-01), Jin
patent: 2009/0001870 (2009-01-01), Suzuki et al.
patent: 2004-363075 (2003-10-01), None
patent: 2007-048548 (2005-08-01), None
Nobuyasu Negishi et al., “High Efficiency Electron-Emission in Pt.SIOx/Si/Al Structure”, Jpn. J. Appl. Phys. vol. 36 (Jul. 1997) pp. L939-L941.
Nobuyoshi Koshida et al., “Cold Electron Emission from Electroluminescent Porous Silicon Diodes”, Jpn. J. Appl. Phys. vol. 34 (Jun. 1995) pp. L705-L707.
Toshiaki Kusunoki et al., “Emission Current Enhancement of MIM Cathodes by Optimizing the Tunneling Insulator Thickness”, IEEE Transactions of electron Devices, vol. 49, No. 6, Jun. 2002, pp. 1059-1065.
E. Yamaguchi et al., “A 10-in. Surface-Conduction Electron-Emitter Display”, Journal of the SID 5/4, 1997, pp. 345-348.
Nobuyasu Negishi et al., “Characterization of an Advanced High-Efficiency Electron Emission Device”, J. Vac. Sci., Technol, B23(2), Mar./Apr. 2005, pp. 682-686.

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