Image defect inspecting apparatus and image defect...

Details Image defect inspecting apparatus and image defect... Image defect inspecting apparatus and image defect...

2007-07-03

2007-07-03

Bali, Vikkram (Department: 2624)

Image analysis

Applications

Manufacturing or product inspection

C382S182000

Reexamination Certificate

active

10377663

ABSTRACT:
An image defect inspecting apparatus of the present invention includes a template image producing section for producing a template image from reference image data, a corresponding image extracting section for extracting a predetermined image located at a position corresponding to a template image from digital data of a scanned image for inspection, data embedding sections for embedding desired same pattern data into the template image and the image extracted by the corresponding image extracting section, a normalized correlation value calculation processing unit for acquiring a normalized correlation coefficient from the template image and the extracted image, into which the pattern data is embedded, and a defect judging section for judging as to whether a defect is present by comparing the normalized correlation coefficient acquired by the normalized correlation value calculation processing unit with a predetermined threshold value so as to acquire a large/small relationship thereof.

REFERENCES:
patent: 6363381 (2002-03-01), Lee et al.
patent: 2003/0113000 (2003-06-01), Hyoki et al.
patent: 7-121711 (1995-05-01), None
patent: 9-62841 (1997-03-01), None

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