Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2011-01-25
2011-01-25
Seth, Manav (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C382S181000, C382S190000, C348S086000, C348S091000
Reexamination Certificate
active
07876950
ABSTRACT:
An image capturing method and apparatus for pattern recognition of an electronic device are provided in which an electronic device is moved relative to a vision system for positioning the vision system over a target position on the electronic device, and when the vision system is positioned to view the target position, the vision system is operative to capture an image of the target position while the electronic device is undergoing relative motion with respect to the vision system without stopping. Thus, the time taken for pattern recognition can be significantly reduced.
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patent: 6700122 (2004-03-01), Matsui et al.
patent: 2002/0196336 (2002-12-01), Batson et al.
patent: 2004/0156054 (2004-08-01), Christoph
Chinese Office Action mailed Jun. 19, 2009 in corresponding Chinese Patent Application No. 2007101460159.
Cheng Mei Kwong
Law Hon Shing
Yu Wei
ASM Assembly Automation LTD
Ostrolenk Faber LLP
Seth Manav
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