Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2011-01-11
2011-01-11
Hung, Yubin (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C382S145000, C382S151000
Reexamination Certificate
active
07869645
ABSTRACT:
Embodiments of the present invention enable image capture and validation. Certain applications of the present invention are its use in various embodiments of a system for inspection of a printed circuit board (“PCB”) substrate. In embodiments, an image capture system comprising a camera and a two-dimensional surface supporting an image may be calibrated based on configuration parameters of an image to be captured and of a simulated reference bitmap based on the image. In embodiments, the position of the image to be captured on the two-dimensional surface is determined based on calibration parameters. In embodiments, consistency of quality of captured images is maintained by validating selected characteristics of each image as it is being captured.
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Hung Yubin
Seiko Epson Corporation
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