Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2005-10-25
2005-10-25
Mehta, Bhavesh M. (Department: 2625)
Image analysis
Applications
Manufacturing or product inspection
C348S092000, C348S125000, C348S127000, C356S237100, C356S428000, C250S306000, C700S110000
Reexamination Certificate
active
06959108
ABSTRACT:
In an inspection system, workpieces to be inspected are consecutively and automatically launched to pass unsupported through the field of view of a plurality of cameras. As a workpiece passes through the field of view of the cameras, a sensor is activated which communicates with a computer system to activate the cameras to capture an unobstructed image, or image data, of the workpiece. The image data is then analyzed by a computer program to verify whether the image data indicates that the workpiece does not meet established criteria and therefore is considered defective. If the image does not meet the established criteria, the workpiece is rejected and segregated from workpieces which have not been identified as defective.
REFERENCES:
patent: 5026982 (1991-06-01), Stroman
patent: 5153668 (1992-10-01), Katzir et al.
patent: 5184732 (1993-02-01), Ditchburn et al.
patent: 5351078 (1994-09-01), Lemelson
patent: 5434616 (1995-07-01), Anger et al.
patent: 5499055 (1996-03-01), Anger et al.
patent: 5591462 (1997-01-01), Darling et al.
patent: 5748324 (1998-05-01), Howarth et al.
patent: 5898169 (1999-04-01), Nordbryhn
patent: 5957306 (1999-09-01), Hoffman
patent: 6205237 (2001-03-01), Focke et al.
patent: 6255683 (2001-07-01), Radens et al.
Bartelt Todd F.
Larson Robert E.
Sizemore Richard A.
Carter Aaron
Interactive Design Inc.
Mehta Bhavesh M.
Shughart Thomson & Kilroy PC
LandOfFree
Image based defect detection system does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Image based defect detection system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Image based defect detection system will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3484331