Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent
1995-05-22
1996-09-03
Gonzalez, Frank
Optics: measuring and testing
By alignment in lateral direction
With registration indicia
250548, G01B 1100
Patent
active
055528929
ABSTRACT:
An illumination optical system and an alignment apparatus suitable for reticle alignment in the projection exposure apparatus. There is provided an illumination optical system having parallel beam supply means for supplying a parallel beam and a light guide for guiding the parallel beam from the parallel beam supply means to a target illumination object, comprising diffusion means, arranged between the parallel beam supply means and the light guide, for diffusing the parallel beam, wherein an incident end face of the light guide is arranged to be inclined by a predetermined angle with respect to a plane perpendicular to a direction of incidence of the parallel beam onto the diffusion means.
REFERENCES:
patent: 2983193 (1961-05-01), Schade
patent: 4402596 (1983-09-01), Kanatani
patent: 4870452 (1989-09-01), Tanimoto et al.
patent: 4938598 (1990-07-01), Akiyama et al.
patent: 5150173 (1992-09-01), Isobe et al.
Nikon Industrial Microscopes published on Jan. 1, 1991 by Nikon.
Metaphot-66/Optiphot-66 published on Oct. 17, 1984 by Nikon.
Gonzalez Frank
Kim Robert
Nikon Corporation
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