Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate
2008-03-04
2008-03-04
Nguyen, Sang H. (Department: 2886)
Optics: measuring and testing
Inspection of flaws or impurities
C250S226000, C209S581000, C209S582000, C382S110000
Reexamination Certificate
active
11564622
ABSTRACT:
An illumination device for use with a product inspection machine inspecting products according to at least one characteristic. The invention also pertains to an illumination device for use in sorting machines that optically sort or separate nonstandard fungible objects from standard objects as they pass a viewing station by viewing such objects illuminated by at least one wavelength. The invention includes a plurality of arrays of semiconductor light sources impinging on passing product and at least one array of semiconductor light sources of wavelength and intensity equal to the plurality of arrays impinging on a background surface for detection and comparison.
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Cohn Avi P.
Mack, Jr. Larry H.
Crain Caton & James P.C.
Hudson III James E.
Nguyen Sang H.
Satake USA Inc.
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