Illuminance distribution measuring system

Details Illuminance distribution measuring system Illuminance distribution measuring system

1990-06-25

1991-11-26

Turner, Samuel

Optics: measuring and testing

Lamp beam direction or pattern

G01J 100

Patent

active

050678116

ABSTRACT:
An illuminance distribution measuring system which includes a two-dimensional (area) sensor array to be disposed on the surface being illuminated by a pulsed laser beam from a pulsed laser and a signal processor operable, in response to output signals of the sensor array, to detect the illuminance distribution on the surface being illuminated.

REFERENCES:
patent: 4320462 (1982-03-01), Lund et al.
patent: 4619508 (1986-10-01), Shibuya et al.
patent: 4799791 (1989-01-01), Echizen et al.

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