Active solid-state devices (e.g. – transistors – solid-state diode – Thin active physical layer which is – Heterojunction
Reexamination Certificate
2006-05-16
2006-05-16
Pham, Long (Department: 2814)
Active solid-state devices (e.g., transistors, solid-state diode
Thin active physical layer which is
Heterojunction
C257S079000, C257S094000
Reexamination Certificate
active
07045808
ABSTRACT:
A III–V nitride semiconductor substrate comprising a III–V nitride semiconductor single crystal at least in a surface portion thereof, the product of [H] and [D] being 1×1025or less, wherein [H] represents the concentration of hydrogen atoms (the number of hydrogen atoms per cm3) in a surface portion of the single crystal, and [D] represents a dislocation density (the number of dislocations per cm2) on a single crystal surface.
REFERENCES:
patent: 6736894 (2004-05-01), Kawahara et al.
patent: 2003/0038302 (2003-02-01), Yanashima et al.
patent: 2003/0183160 (2003-10-01), Fujikura et al.
patent: 2000-252217 (2000-09-01), None
patent: 2003-59835 (2003-02-01), None
Hitachi Cable Ltd.
Pham Long
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