Active solid-state devices (e.g. – transistors – solid-state diode – Heterojunction device – Field effect transistor
Reexamination Certificate
2004-12-03
2008-10-21
Landau, Matthew C (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Heterojunction device
Field effect transistor
C257S192000, C257SE29246, C257SE29252
Reexamination Certificate
active
07439555
ABSTRACT:
A III-nitride trench device has a vertical conduction region with an interrupted conduction channel when the device is not on, providing an enhancement mode device. The trench structure may be used in a vertical conduction or horizontal conduction device. A gate dielectric provides improved performance for the device by being capable of withstanding higher electric field or manipulating the charge in the conduction channel. A passivation of the III-nitride material decouples the dielectric from the device to permit lower dielectric constant materials to be used in high power applications.
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O. Ambacher et al.,Two-dimensional electron gases induced by spontaneous and piezoelectric polarization charges in N- and Ga-face AlGaN/GaN heterostructures, Journal of Applied Phys., vol. 85, No. 6, Mar. 15, 1999 (pp. 3222-3233).
Beach Robert
Bridger Paul
International Rectifier Corporation
Landau Matthew C
Ostrolenk Faber Gerb & Soffen, LLP
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