Identifying process and temperature of silicon chips

Details Identifying process and temperature of silicon chips Identifying process and temperature of silicon chips

2003-12-31

2010-06-22

Bhat, Aditya (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

Reexamination Certificate

active

07742887

ABSTRACT:
Systems and techniques are disclosed relating to communications. The systems and techniques include determining the temperature and process speed of chips used in communications devices. The systems and techniques include measuring the output of ring oscillators embedded in the chips, and calculating the temperature and process speed therefrom.

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