Identifying peaks in mass spectrometry data

Details Identifying peaks in mass spectrometry data Identifying peaks in mass spectrometry data

2011-07-26

2011-07-26

Wachsman, Hal D (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S076000, C702S023000, C702S032000, C250S282000

Reexamination Certificate

active

07987060

ABSTRACT:
A method of processing Fourier Transform Mass Spectrometry (FTMS) data includes performing a Fourier Transform of a part of a time domain transient and identifying from that transformed data signal peaks representative of the presence of ions. After peak identification, the full transient is then transformed, and the peaks identified in the partial transient transform are used to locate true peaks in the transformed full transient. The number of ‘false’ peaks resulting from random noise has been found to correlate to the resolution, so that using a partial transient to identify true peaks reduces the risk of false peaks being included; nevertheless this information can then be applied to the full data set when transformed. As an alternative, different parts of the full data set can be transformed and then correlated; because any noise will be random, false peaks should occur at different places in the two partial transforms.

REFERENCES:
patent: 4755670 (1988-07-01), Syka et al.
patent: 4761545 (1988-08-01), Marshall et al.
patent: 5175430 (1992-12-01), Enke et al.
patent: 5418826 (1995-05-01), Sato et al.
patent: 5886346 (1999-03-01), Makarov
patent: 5995989 (1999-11-01), Gedcke et al.
patent: 6403955 (2002-06-01), Senko
patent: 2003/0042414 (2003-03-01), Smith et al.
patent: 2004/0195500 (2004-10-01), Sachs et al.
patent: 2 410 123 (2005-07-01), None
patent: WO 2004/097581 (2004-11-01), None
patent: WO 2005/031791 (2005-04-01), None
D. Alan Hanna, “FTMS Noise Characterization,” Preceedings of the ASMS Conference on Mass Spectrometry and Allied Topics, p. 435-436, (May 26, 1985).
D. Alan Hanna, “Noise Analysis for FTMS Spectra,” Proceedings of the 10th International Mass Spectometry Conference, p. 1211-1212, (May 26, 1985).
Alan G. Marshall, “Fourier Transform Ion Cyclotron Resonance Mass Spectrometry: A primer,” Mass Spectrometry Reviews, vol. 17 (No. 1), p. 1-35, (May 6, 1998).
Alan G. Marshall, “Milestones in Fourier Transform Ion Cyclotron Resonance Mass Spectrometry Technique Development,” J.Mass Spectrom., vol. 200 ( No. 1-3), p. 331-356, (2000).
F. R. Verdun et al., “Effects of Noise, Time-Domain Damping, Zero-Filling and the FFT Algorithm on the ‘Exact’ Interpolation of Fast Fourier Transform Spectra,” Applied Spectroscopy USA, vol. 42 (No. 5), pp. 715-721, (1988).
A. Makarov et., “Dynamic Range of Mass Accuracy in LTQ Orbitrap Hybrid Mass Spectrometer,” Journal of the American Society of Mass Spectrometry, Elsevier Science Inc. (US), vol. 17 (No. 7), pp. 977-982, (2006).
P. Kaur et al., “Algorithms for Automatic Interpretation of High Resolution Mass Spectra,” Journal of the American Society for Mass Spectrometry, Elsevier Science Inc. (US), vol. 17 (No. 3), pp. 459-468, (2006).
S. Hofstadler et al., “Isotopic Beat Patterns in Fourier Transform Ion Cyclotron Resonance Mass Spectrometry: Implications for High Resolution Mass Measurements of Large Biopolymers,” International Journal of Mass Spectrometry and Ion Processes, vol. 132 (No. 1-2), pp. 109-127, (1994).
D. Alan Hanna, “FTMS Noise Characterization,” Proc. 33rd Annual Conference on Mass Spectrometry and Allied Topics; San Diego, ASMS, 1985, pp. 435-436.
D. Alan Hanna, “Noise Analysis for FTMS Spectra,” Advances in Mass Spectrometry 1985: Proceedings of the 10th International Mass Spectrometry Conference, John Wiley and Sons Ltd., 1985, pp. 1211-1212.
W. H. Benner, “A Gated Electrostatic Ion Trap to Repetitiously Measure the Charge and m/z of Large Electrospray Ions,” Analytical Chemistry, 1997, 69, pp. 4162-4168.
Brock et al., “Hadamard Transform Time-of-Flight Mass Spectrometry,” Analytical Chemistry, 1998, 70, pp. 3735-3741.

Affiliated with

Also associated with

Rating

Identifying peaks in mass spectrometry data does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Identifying peaks in mass spectrometry data, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Identifying peaks in mass spectrometry data will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2705872