Identifying optical fiber segments and determining...

Optics: measuring and testing – For optical fiber or waveguide inspection

Reexamination Certificate

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C385S013000

Reexamination Certificate

active

07440087

ABSTRACT:
Complex data is obtained from OFDR backscatter measurements for an optical device under test (DUT). That complex scatter pattern data may be used along with a previously-determined fiber segment pattern to identify the fiber segment within the DUT, even when the DUT is an optical network DUT that includes multiple fibers coupled to perform one or more functions. In other non-limiting example applications, the OFDR scatter pattern data can be used to identify where in the DUT a loss occurred and where in the DUT a temperature change occurred.

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