Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2011-06-28
2011-06-28
Charioui, Mohamed (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C324S541000, C324S525000, C379S001010, C379S030000
Reexamination Certificate
active
07970559
ABSTRACT:
Methods, systems, and articles of manufacture consistent with the present invention determine the type of damage to a wire, the amount of damage, and the location of the damage based on the wire's broadband impedance measured from a single measurement point. The type of damage is determined by comparing the wire's calculated dielectric function, resistance and inductance to known values that correspond to types of wire damage. The amount of damage is determined by comparing the wire's low-frequency impedance phase to known low-frequency impedance phase information that corresponds to a known amount of wire damage. The location of damage is determined by comparing the wire's high-frequency impedance phase to known high-frequency impedance phase information that corresponds to a known location of wire damage.
REFERENCES:
patent: 5502392 (1996-03-01), Arjavalingam et al.
patent: 2004/0046570 (2004-03-01), Teich
Kendig Martin W.
Rogovin Daniel N.
Charioui Mohamed
Suglo Janet L
The Boeing Company
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