Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1994-12-05
1996-02-06
Wieder, Kenneth A.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324523, 324756, 324760, G01R 3100
Patent
active
054898510
ABSTRACT:
A method and apparatus for determining whether semiconductor components are electrically connected to a printed circuit board. A voltage (or current) is connected to two traces leading to connections to a semiconductor component to be tested. The initial current (or voltage) is measured at an initial temperature. Then, the temperature of the semiconductor is changed. Current (or voltage) is measured again after the temperature change. A change in current (or voltage) indicates that the semiconductor component is electrically connected to the trace.
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Grove, A., Physics and Technology of Semiconductor Devices, John Wiley and Sons, Inc., 1967, pp. 178, 188, Figures 6.19b and 6.23b.
Heumann John M.
Peiffer Ronald J.
Hewlett--Packard Company
Tobin Christopher M.
Wieder Kenneth A.
Winfield Augustus W.
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