Identification of pin-open faults by capacitive coupling through

Details Identification of pin-open faults by capacitive coupling through Identification of pin-open faults by capacitive coupling through

1990-12-20

1992-06-23

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324555, 324718, 324158R, H01H 3104

Patent

active

051246600

ABSTRACT:
Disclosed is a system that determines whether input and output pins of semiconductor components are present and properly soldered to a printed circuit board. The system includes an oscillator which is connected to a metallic electrode placed on top of an integrated circuit package. A probe pin in a bed of nails tester is connected to a current measuring device and connected to a printed circuit board wiring trace that is soldered to the pin being tested. The oscillator signal is capacitively coupled through the integrated circuit package to the pin being tested, so if current is measured by the current measuring device, the pin is connected to the printed circuit board.

REFERENCES:
patent: 4056773 (1977-11-01), Sullivan
patent: 4186338 (1980-01-01), Fichtenbaum
patent: 4779041 (1988-10-01), Williamson, Jr.
patent: 4789829 (1988-12-01), Stribling
patent: 5006808 (1991-04-01), Watts

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