Identification of pin-open faults by capacitive coupling through

Details Identification of pin-open faults by capacitive coupling through Identification of pin-open faults by capacitive coupling through

1995-03-07

1996-09-17

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324538, 324686, G01R 3102

Patent

active

055572090

ABSTRACT:
Disclosed is a system that determines whether input and output pins of semiconductor components are present and properly soldered to a printed circuit board. The system uses an oscillator which supplies a signal, typically ten kilohertz (10 kHz) at 0.2 volts, to the pin under test. A conductive electrode is placed on top of the component package. The electrode is connected to a current measuring device. Another pin of the component is connected to the common signal return. Typically the other pin is chosen to be a power or ground pin of the component.

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