Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2011-06-14
2011-06-14
Nguyen, Ha Tran T (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
07960985
ABSTRACT:
An apparatus in an example comprises an integrated circuit and one or more resistors. The integrated circuit comprises an internal current source and an external interface pin. The one or more resistors arc external to the integrated circuit and coupled with the external interface pin of the integrated circuit. Application of current from the internal current source of the integrated circuit to the one or more resistors through the external interface pin serves to generate a voltage that is employed to identify the integrated circuit.
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Bliley Paul D.
DeHaven Maxwell Scott
Robertson Brian E.
Rossi John
Wong Tuan
Hewlett--Packard Development Company, L.P.
Nguyen Ha Tran T
Nguyen Tung X
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