Identification of defects in emitter-coupled logic circuits

Details Identification of defects in emitter-coupled logic circuits Identification of defects in emitter-coupled logic circuits

1988-11-14

1990-02-20

Miller, Stanley D.

Electrical transmission or interconnection systems

Nonlinear reactor systems

Parametrons

3074821, 3073031, 307355, 371 251, 371 221, H03K 19086, H03K 19003, H03K 1762, G11C 1140

Patent

active

049029169

ABSTRACT:
An ECL logic circuit uses a single resistor in place of separate current-source and emitter-follower resistors. A single tap connects a point on this resistor to the ground bus, and the signal-output line connects to this resistor by a contact which is separate from the contact connecting the emitter of the ouput transistor to the resistor.

REFERENCES:
patent: 4410816 (1983-10-01), Kanai
patent: 4517476 (1985-05-01), Barre
patent: 4580066 (1986-01-01), Berndt
patent: 4628217 (1986-12-01), Berndt
patent: 4658400 (1987-04-01), Brown et al.
patent: 4757216 (1988-07-01), Tanahashi

Affiliated with

Also associated with

Rating

Identification of defects in emitter-coupled logic circuits does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Identification of defects in emitter-coupled logic circuits, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Identification of defects in emitter-coupled logic circuits will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1617956