Image analysis – Pattern recognition – Template matching
Reexamination Certificate
2006-03-31
2010-06-29
Hung, Yubin (Department: 2624)
Image analysis
Pattern recognition
Template matching
C382S190000, C348S247000
Reexamination Certificate
active
07747081
ABSTRACT:
A photoelectric sensor array is labelled by accumulating charge, preferably charge from a dark current, in at least a portion of the sensor array and reading out the accumulated charge to form an image to determine locations of atypical pixels in the portion of the sensor array. A signature of the sensor array is generated from the locations of atypical pixels and stored. The array is subsequently identified by re-accumulating charge in the portion of the array to form a signature based on the atypical pixels for comparison with the stored signature.
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Hadfield Kevin
Moody Ian
E2V Technologies (UK) Limited
Gozzi Justine A.
Hung Yubin
Kinberg Robert
Venable LLP
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