ID recognition apparatus and ID recognition sorter system...

Details ID recognition apparatus and ID recognition sorter system... ID recognition apparatus and ID recognition sorter system...

2006-09-12

2006-09-12

Wu, Jingge (Department: 2624)

Image analysis

Applications

Manufacturing or product inspection

C382S145000, C382S147000, C382S181000

Reexamination Certificate

active

07106896

ABSTRACT:
A semiconductor wafer ID recognition apparatus includes an image sensing optical section and recognition processing section. The image sensing optical section reads at least one identification information (ID) marked at an arbitrary position on a semiconductor wafer in accordance with a plurality of first read optical conditions registered in advance. The recognition processing section performs recognition processing including calculation of an evaluation score representing a read likelihood ratio for an image output from the image sensing optical section every read optical condition, and adopts a recognition result under a read optical condition exhibiting the highest score as an ID of the semiconductor wafer.

REFERENCES:
patent: 4499595 (1985-02-01), Masaitis et al.
patent: 5909276 (1999-06-01), Kinney et al.
patent: 6236903 (2001-05-01), Kim et al.
patent: 6697517 (2004-02-01), Hunter
patent: 6707544 (2004-03-01), Hunter et al.
patent: 2000-55820 (2000-02-01), None
patent: 1998-016060 (1998-05-01), None

Affiliated with

Also associated with

Rating

ID recognition apparatus and ID recognition sorter system... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with ID recognition apparatus and ID recognition sorter system..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and ID recognition apparatus and ID recognition sorter system... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3590139