IC which eliminates support bias influence on dielectrically iso

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357 47, 357 50, 357 59, 437 33, H01L 2712

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048070122

ABSTRACT:
In integrated circuits having device islands separated laterally by support to polycrystalline regions and a dielectric layer, a shield layer is provided along the side walls at the dielectric layer having an impurity concentration sufficiently greater than the island's impurity concentration to eliminate support bias influence without seriously affecting the PN junction in the island. The shield impurity concentration is less than the region forming a PN junction with the island and preferably is below 1.times.10.sup.13 ions/cm.sup.2 and a peak impurity concentration less than 5.times.10.sup.16 ions/cm.sup.3.

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