IC tester socket

Details IC tester socket IC tester socket

1988-06-08

1989-10-10

Desmond, Eugene F.

Electrical connectors

Coupling part with actuating means urging contact to move...

Contractile receptacle

439 70, 439266, H01R 909, H01R 13631

Patent

active

048728500

ABSTRACT:
An IC tester socket comprises a spring for keeping the socket body and the spacer frame in their state of being spaced apart from each other with a predetermined interval; and contacting pins each having a spring portion shaped in a pair of arcuate forms, in order to ensure the contact between the lead terminals of an IC requiring testing and the contacting pins to be realized positively and stably and to make it possible for the socket to stand its use for a prolonged period of time. The arm of each contacting pin which is brought into contact with the side face to its mating lead terminal of the IC is adapted to contact the side face of the lead terminal, and is so shaped as to be able to lock the IC package at the position of contact of this arm.

REFERENCES:
patent: 4491377 (1985-01-01), Pfaff
patent: 4630875 (1986-12-01), Korsunsky et al.
patent: 4676571 (1987-06-01), Petersen et al.

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