IC tester for preventing damage from electrostatic discharge...

Details IC tester for preventing damage from electrostatic discharge... IC tester for preventing damage from electrostatic discharge...

2005-08-02

2005-08-02

Nguyen, Vinh P. (Department: 2829)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

Reexamination Certificate

active

06924635

ABSTRACT:
An IC tester for preventing damage from electrostatic discharge (ESD) and operation method thereof. The IC tester contains a temperature control oven chamber, an oven door connected to the temperature control oven chamber, at least a pair of thermal-isolated bars situated on one side of the oven door, and an actuating bar situated in the oven door. The actuating bar is connected to the thermal-isolated bars for controlling the pair of thermal-isolated bars to open or close. Therefore a DUT board is capable of passing through the pair of thermal-isolated bars for being loaded on the oven door and for not rubbing against the thermal-isolated bars when the pair of thermal-isolated bars is open so as to avoid ESD.

REFERENCES:
patent: 4316231 (1982-02-01), Michel
patent: 4588092 (1986-05-01), Moechnig et al.
patent: 6563319 (2003-05-01), Kraz

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