IC tester capable of changing strobe position in accordance with

Details IC tester capable of changing strobe position in accordance with IC tester capable of changing strobe position in accordance with

1991-08-20

1993-03-02

Nguyen, Vinh

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 731, 371 251, 371 151, G01R 3128

Patent

active

051912813

ABSTRACT:
An IC tester correctly carries out a function test on an integrated circuit (IC). The IC tester selects one of two strobe position signals depending on whether an expected value is for testing a rise or a fall of an output signal of the tested IC, and compares the expected value with the output signal at a proper timing specified by the selected strobe position signal. The IC tester avoids an error of test due to a deviation between the positions of the rise and fall of the output signal of the tested IC.

REFERENCES:
patent: 4761607 (1988-08-01), Shiragasawa et al.
patent: 4774460 (1988-09-01), Todokoro et al.
patent: 4775977 (1988-10-01), Dehara
patent: 4965511 (1990-10-01), Nishimura et al.
patent: 5029168 (1991-07-01), Chan

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