IC test instrument

Details IC test instrument IC test instrument

1992-01-22

1994-01-18

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 725, G01R 1067

Patent

active

052802361

ABSTRACT:
An IC test instrument has an IC test circuit for an integrated semiconductor chip. A probe card is coupled to the IC test circuit. Probe needles are disposed on the probe card. The probe needles comprise a cobalt-based alloy containing at least 10 weight-percent of chromium. A passive-state film comprised of chromium oxide is formed on one end of the probe needles, and a solder-enhancing metallic layer is formed on the other end of the probe needles. The passive-state film may be formed by electrolytic polishing or chemical solution immersion. The passive-state film prevents a contaminating substance, such as aluminum oxide, from adhering to the needle. The probe needle substrate may be bent and may be formed by wiredrawing a cobalt-based alloy.

REFERENCES:
patent: 3818163 (1974-06-01), Robinson
patent: 4067379 (1978-01-01), Hassler et al.
patent: 4777335 (1988-10-01), Okutomi et al.
patent: 4891480 (1990-01-01), Holden, Jr. et al.
patent: 4983908 (1991-01-01), Tada et al.
patent: 5084672 (1992-01-01), Ikeuchi et al.

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