IC test apparatus

Details IC test apparatus IC test apparatus

1992-05-12

1993-08-31

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

371 221, G01R 3128

Patent

active

052412644

ABSTRACT:
The output of a tri-state driver is connected with I/O pins of test IC elements via load resistors. The I/O pins are connected to the input terminals of corresponding comparators. Under the state where the I/O control signal given to the driver indicates an input condition, the driver generates either the first or the second level corresponding to the logic level of input test pattern data. Under the state where the I/O control signal indicates an output condition, the driver generates the third level which is different from the first and the second level.

REFERENCES:
patent: 4236246 (1980-11-01), Skilling
patent: 4348759 (1982-09-01), Schnurmann
patent: 4523312 (1985-06-01), Takeuchi
patent: 4571724 (1986-02-01), Belmondo et al.
patent: 4583223 (1986-04-01), Inoue et al.
patent: 4637020 (1987-01-01), Schinabeck
patent: 4651088 (1987-03-01), Sawada
patent: 4743842 (1988-05-01), Langone et al.
patent: 4814638 (1989-03-01), Weick
patent: 4908576 (1990-03-01), Jackson
patent: 5101153 (1992-03-01), Morong, III

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