Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor
Patent
1990-12-06
1992-03-10
Cuchlinski, Jr., William A.
Thermal measuring and testing
Temperature measurement
By electrical or magnetic heat sensor
374163, 307310, G01K 700, H01L 3100
Patent
active
050945467
ABSTRACT:
An IC temperature sensor has a reference voltage circuit for providing a reference voltages; a voltage comparing circuit provided with first and second input transistors constructed such that a ratio of sizes of emitters of the first and second input transistors is set to a predetermined ratio; a device for inputting outputs from the reference voltage circuit to the base of the input transistors; a device for providing a predetermined potential for the other input transistor; and a device for outputting a voltage signal proportional to temperature with the difference in size between the emitters of the input transistors.
REFERENCES:
patent: 3758791 (1973-09-01), Taniguchi et al.
patent: 3809929 (1974-05-01), Vittoz
patent: 4021722 (1977-05-01), Crowle
patent: 4071813 (1978-01-01), Dobkin
patent: 4497586 (1985-02-01), Nelson
patent: 4574205 (1986-03-01), Nagano
patent: 4625128 (1986-11-01), Boeckmann
patent: 4652144 (1987-03-01), Gunther et al.
Bennett G. Bradley
Cuchlinski Jr. William A.
Ricoh & Company, Ltd.
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