Special receptacle or package – Holder for a removable electrical component – Including component positioning means
Patent
1997-08-01
2000-06-06
Hess, Douglas
Special receptacle or package
Holder for a removable electrical component
Including component positioning means
2064595, 206725, 4147889, 414940, B65D 8530
Patent
active
060707313
DESCRIPTION:
BRIEF SUMMARY
BACKGROUND OF THE INVENTION
1. Field of the Invention
The present invention relates to an IC transporting and handling system (commonly referred to as IC handler) for transporting semiconductor devices, specifically ICs (semiconductor integrated circuits) which are typical examples thereof, to test them through a test section and to sort the tested ICs on the basis of the test results, and particularly, to a tray storage device for storing IC receiving trays each of which is used for receiving ICs to be tested or the tested ICs in an IC transporting and handling system and a mounting apparatus for mounting one or more of such tray storage device at a predetermined position in the IC transporting and handling system.
2. Background of the Related Art
Many of semiconductor device testing apparatus (hereinafter referred to as IC tester) for measuring the electrical characteristics of semiconductor devices by applying signals of a predetermined test pattern to devices to be tested, i.e. devices under test (commonly called DUT) have a semiconductor transporting and handling apparatus (hereinafter referred to as IC handler) integrally incorporated therein for transporting semiconductor devices for testing and sorting the tested semiconductor devices on the basis of the test results.
An example of the prior art IC handler called "forced horizontal transporting system" is shown diagrammatically in FIG. 1. The illustrated IC handler 10 comprises a loader section 11 where ICs 15 to be tested which a user has beforehand loaded on a customer (user) tray 13 are transferred and reloaded onto a test tray 14 capable of withstanding high/low temperatures, a constant temperature or thermostatic chamber 20 including a test section or testing zone 21 for receiving and testing the ICs from the loader section 11, and an unloader section 12 where the tested ICs 15 which have been carried on the test tray 14 out of the constant temperature chamber 20 subsequently to undergoing a test in the test section 21 are transferred from the test tray 14 to the customer tray 13 to be reloaded on the latter (generally, the tested ICs are often sorted into categories based on the data of the test results and transferred onto the corresponding customer trays 13 each for one category). Depending upon the type of ICs to be tested (in the case of the surface mount type ICs or the like packaged in a dual-in-line flat packages, for example), each IC may be loaded on an IC carrier, and then the IC carrier loaded with the IC may be placed on a customer tray.
The test tray 14 is moved in a circulating manner from and back to the loader section 11 sequentially through the constant temperature chamber 20 and the unloader section 12. More specifically, the test tray 14 loaded with ICs 15 to be tested is transported from the loader section 11 to a soak chamber 22 within the constant temperature chamber 20 where the ICs 15 placed on the tray 14 are heated or cooled to a predetermined constant temperature. Generally, the soak chamber 22 is adapted to store a plurality of (say, nine) test trays 14 stacked one on another such that a test tray 14 newly received from the loader section 11 is stored at the uppermost of the stack while the bottom test tray is delivered to the test section 21.
The ICs 15 to be tested are heated or cooled to a predetermined constant temperature while the test tray 14 is moved from the top to the bottom of the stack within the soak chamber 22. The heated or cooled ICs 15 together with the test tray 14 are then transported while maintained at the constant temperature from the soak chamber 22 to the test section 21 where the ICs under test are brought into electrical contact with IC sockets (not shown) disposed in the test section 21 to be measured for their electrical characteristics.
Upon completion of the test, the tested ICs 15 are transported from the testing zone 21 to an exit chamber 23 where they are restored to the ambient temperature. Like the soak chamber 22, the exit chamber 23 is also adapted to accommodate test trays in
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Kobayashi Yoshito
Makamura Hiroto
Advantest Corporation
Hess Douglas
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