IC lead inspection system configurable for different camera posi

Details IC lead inspection system configurable for different camera posi IC lead inspection system configurable for different camera posi

1996-11-12

1999-11-23

Couso, Jose L.

Image analysis

Applications

Manufacturing or product inspection

382151, 382154, G01B 1103, G06K 900

Patent

active

059914343

ABSTRACT:
A system for inspecting leads of an IC using at least one camera is provided, where the system permits configuration of the camera to various positions. The camera provides a digitized frame of the IC leads. The system includes a set of configurable parameters for defining which leads of the IC are imaged in which of the digitized frames. The system also includes a computer for calculating the position of the leads on the IC being inspected in three dimensions, and for comparing these calculated positions to ideal known positions in determining whether the IC leads meet desired manufacturing tolerances.

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patent: 5402505 (1995-03-01), Roy et al.
patent: 5414458 (1995-05-01), Harris et al.
patent: 5452080 (1995-09-01), Tomiya
patent: 5528371 (1996-06-01), Sato et al.
patent: 5745593 (1998-04-01), Wahawisan et al.

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