IC element testing device

Details IC element testing device IC element testing device

1994-03-17

1996-01-02

Voeltz, Emanuel T.

Excavating

371 211, 371 214, 324705, 324 731, 365201, G06F 1114

Patent

active

054815517

ABSTRACT:
An IC element testing device includes a test pattern generating unit for generating test patterns, a power supply unit for generating a power supply voltage, a superposed voltage generating unit for generating a superposed voltage, and a superposing unit for superposing the superposed voltage on the power supply voltage and for outputting a superposed power supply voltage to an IC element to which the test patterns generated by the test pattern generating unit are applied.

REFERENCES:
patent: 4839865 (1989-06-01), Sato et al.
patent: 5051995 (1991-09-01), Tobita
patent: 5155701 (1992-10-01), Komori et al.
patent: 5157629 (1992-10-01), Sato et al.
patent: 5187685 (1993-02-01), Sato et al.
patent: 5283762 (1994-02-01), Fujishima
patent: 5300880 (1994-04-01), Okubo et al.

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