IC device and a system for testing the same

Details IC device and a system for testing the same IC device and a system for testing the same

1984-10-25

1987-09-01

Gruber, Felix D.

Boots, shoes, and leggings

324 73PC, 364488, G06F 1104, G01R 3128

Patent

active

046912878

ABSTRACT:
An IC device wherein a source of IC device type-distinguishing data is provided on an IC chip, and a section for drawing out the IC device type-distinguishing data is connected to said source of IC device type-distinguishing data formed on said IC chip.

REFERENCES:
patent: 4070565 (1978-01-01), Borrelli
patent: 4488354 (1984-12-01), Chan et al.
patent: 4493045 (1985-01-01), Hughes, Jr.
patent: 4517661 (1985-05-01), Graf et al.
Patent Abstracts of Japan, vol. 7, No. 72, Mar. 25th, 1983.
A paper of the 12th "Reliability" Symposium; Nishimura et al., 1982, Method for Testing a Wafer Including Various LSI Chips.

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