Electricity: electrical systems and devices – Safety and protection of systems and devices – Load shunting by fault responsive means
Reexamination Certificate
2005-02-11
2008-11-04
Sherry, Michael J (Department: 2836)
Electricity: electrical systems and devices
Safety and protection of systems and devices
Load shunting by fault responsive means
Reexamination Certificate
active
07446990
ABSTRACT:
An ESD protection system for I/O cells of an integrated circuit. The I/O cells of a bank of cells include a first type of I/O cells having ESD trigger circuits and a second type of I/O cells having ESD clamp devices. In one embodiment, the ESD trigger circuits of the first type are located at the same area of an active circuitry floor plan as the area in the floor plan for the ESD clamp devices of the I/O cells of the second type.
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Khazhinsky Michael G.
Miller James W.
Stockinger Michael
Weldon James C.
Clark Christopher J
Dolezal David G.
Freescale Semiconductor Inc.
Sherry Michael J
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