Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-02-21
2006-02-21
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
Reexamination Certificate
active
07003408
ABSTRACT:
For providing a hysteresis characteristic setting device configured by components smaller in number than those of a logic circuit or a comparator circuit for setting a hysteresis characteristic, the device comprises a resistor voltage dividing circuit including two resistors; and a microcomputer including first and second ports and serving as input ports. When an output signal from a low-pass filter circuit is supplied to the device, the voltage of the signal is divided by the two resistors of the resistor voltage dividing circuit and then given to the second port. The microcomputer performs a process according to a combination of levels Hi and Lo detected in the ports, to set a hysteresis characteristic in which an input voltage level corresponding to a threshold voltage level of the first port is a lower limit, and that corresponding to a threshold voltage level of the second port is an upper limit.
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Bui Bryan
Koyo Seiko Co. Ltd.
Lau Tung S.
McGinn IP Law Group PLLC
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