Hybrid orientation field effect transistors (FETs)

Active solid-state devices (e.g. – transistors – solid-state diode – Non-single crystal – or recrystallized – semiconductor... – Non-single crystal – or recrystallized – material with...

Reexamination Certificate

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C257S066000, C257S067000, C257S069000, C257S347000, C257S365000, C257S627000, C257S628000, C257SE21561, C438S149000, C438S479000, C438S517000

Reexamination Certificate

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07102166

ABSTRACT:
A hybrid orientation semiconductor structure and method of forming the same. The structure includes (a) a semiconductor substrate comprising a first semiconductor material having a first lattice orientation; (b) a back gate region on the semiconductor substrate; (c) a back gate dielectric layer on the back gate region; (d) a semiconductor region on the back gate dielectric layer, wherein the semiconductor region is electrically insulated from the back gate region by the back gate dielectric layer, and wherein the semiconductor region comprises a second semiconductor material having a second lattice orientation different from the first lattice orientation; and (e) a field effect transistor (FET) formed on the semiconductor region, wherein changing a voltage potential applied to the back gate region causes a change in a threshold voltage of the FET.

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