Semiconductor device manufacturing: process – Having magnetic or ferroelectric component
Reexamination Certificate
2004-05-18
2010-06-08
Phung, Anh (Department: 2824)
Semiconductor device manufacturing: process
Having magnetic or ferroelectric component
C257S421000, C257SE21665, C257SE27006, C365S158000, C365S173000, C438S129000
Reexamination Certificate
active
07732221
ABSTRACT:
This invention relates to MRAM technology and new variations on MRAM array architecture to incorporate certain advantages from both cross-point and 1T-1MTJ architectures. The fast read-time and higher signal-to-noise ratio of the 1T-1MTJ architecture and the higher packing density of the cross-point architecture are both exploited by combining certain characteristics of these layouts. A single access transistor16is used to read the multiple MRAM cells in a segment of a column, which can be stacked vertically above one another in a plurality of MRAM array layers arranged in a “Z” axis direction.
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Hush Glen
Seyyedy Mirmajid
Dickstein & Shapiro LLP
Lulis Michael
Micro)n Technology, Inc.
Phung Anh
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