Electrical connectors – Preformed panel circuit arrangement – e.g. – pcb – icm – dip,... – With provision to conduct electricity from panel circuit to...
Reexamination Certificate
2006-08-01
2006-08-01
Duverne, Jean Frantz (Department: 2839)
Electrical connectors
Preformed panel circuit arrangement, e.g., pcb, icm, dip,...
With provision to conduct electricity from panel circuit to...
Reexamination Certificate
active
07083428
ABSTRACT:
A hybrid interface apparatus including a fixed base including a contact-locking structure supporting several spring-based contact members, and a nesting member slidably positioned over the fixed base and having a central test area that includes an array of through-holes that are aligned with upper ends of the contact members. To facilitate testing of ICs including both relatively low-speed general-purpose I/O structures and new high-speed I/O structures, the contact members mounted on the contact structure include both low-cost, relatively high-inductance contact members for facilitating communication with the general-purpose I/O structures of the IC, and relatively expensive, low-inductance contact members for facilitating high-speed communications with the high-speed I/O structures of the IC.
REFERENCES:
patent: 5185736 (1993-02-01), Tyrrell et al.
patent: 5639247 (1997-06-01), Johnson et al.
patent: 5955888 (1999-09-01), Frederickson et al.
patent: 6174172 (2001-01-01), Kazama
patent: 6404211 (2002-06-01), Hamel et al.
patent: 6443745 (2002-09-01), Ellis et al.
patent: 2001/0010274 (2001-08-01), Koga et al.
Mahoney David M.
Mardi Mohsen Hossein
Bever Patrick T.
Duverne Jean Frantz
Xilinx , Inc.
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