Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-10-25
2005-10-25
Patel, Paresh (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S755090, C439S066000, C439S083000
Reexamination Certificate
active
06958616
ABSTRACT:
A hybrid interface apparatus including a fixed base including a contact-locking structure supporting several spring-based contact members, and a nesting member slidably positioned over the fixed base and having a central test area that includes an array of through-holes that are aligned with upper ends of the contact members. To facilitate testing of ICs including both relatively low-speed general-purpose I/O structures and new high-speed I/O structures, the contact members mounted on the contact structure include both low-cost, relatively high-inductance contact members for facilitating communication with the general-purpose I/O structures of the IC, and relatively expensive, low-inductance contact members for facilitating high-speed communications with the high-speed I/O structures of the IC.
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Mahoney David M.
Mardi Mohsen Hossein
Bever Hoffman & Harms
Patel Paresh
Ward Thomas A.
Xilinx , Inc.
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